In my talk I will review the latest advances in X-ray characterization of self-assembled nanoparticle films. I will illustrate how the small-angle X-ray scattering (SAXS) can be employed to study two- and three-dimensional self-assembly phenomena. Using the intense synchrotron radiation we can follow formation of nanoparticle assemblies in real-time and space. As an example I will show the formation and collapse of two-dimensional nanoparticle Langmuir film at air/water interface. I will also present the real-time analysis of tree-dimensional nanoparticle crystallization directly during the solvent evaporation. The simultaneous analysis of small- and wide-angle X-ray scattering gives an attractive opportunity to track in-situ the surface and bulk chemical reactions along with nanoparticle re-assembly processes.
In the end I will present applications of self-assembled nanoparticle films for sensing of low gas concentrations and for strain sensors.
Acknowledgements: The work was supported by project - ”Competence center for new materials, advanced technologies and energetics” (ITMS 26240220073)
Кључне речи :
Тематска област:
СИМПОЗИЈУМ А: Наука материје, кондензоване материје
Датум:
28.05.2013.
Бр. отварања:
212
Contemporary Materials - 2013 - Савремени материјали
Датотека уз рад
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